Jeffrey Arnold Christians
College of Engineering
Office: Radiation Lab Rm. 211
B.S.E., Calvin College, 2010
Majors: Chemical Engineering, Chemistry
Kamat, P. V.; Christians, J. A.; Radich, J. G. “Quantum Dot and Nanowire Solar Cells. Hole Transfer as a Limiting Factor.” Langmuir 2014, submitted (Feature Article).
Kim, J.-P.; Christians, J. A.; Choi, H.; Krishnamurty, S; Kamat, P. V. “CdSeS Nanowires. Compositionally Controlled Band Gap and Charge Dynamics.” J. Phys. Chem. Lett., 2014, submitted.
Christians, J. A.; Leighton Jr., D. T.; Kamat, P. V. “Rate Limiting Interfacial Hole Transfer in Solid-State Solar Cells.” Energy Environ. Sci. 2014, Advance Article.
Christians, J. A.; Fung, R. C. M.; Kamat, P. V. “An Inorganic Hole Conductor for Organo-Lead Halide Perovskite Solar Cells. Improved Hole Conductivity with Copper Iodide.” J. Am. Chem. Soc. 2014, 136 (2), 758-764.
Christians, J. A.; Kamat, P. V. “Trap and Transfer. Two-Step Hole Injection Across the Sb2S3/CuSCN Interface in Solid State Solar Cells.” ACS Nano 2013, 7 (9), 7967-7974.
Opperwall, S. R.; Divakaran, A.; Porter, E. G.; Christians, J. A.; Denhartigh, A. J.; Benson, D. E. Wide “Dynamic Range Sensing with Single Quantum Dot Biosensors.” ACS Nano 2012, 6, 8078-86.
Summary of Activities/Interests
Jeff is a fourth year doctoral student in the Chemical and Biomolecular Engineering Department at Notre Dame. He is originally from Grand Rapids, Michigan where he received his bachelor degree in Chemical Engineering from Calvin College in 2010 and performed research on using individual CdSe quantum dots as wide dynamic range fluorescent biosensors. Jeff's work in the Kamat lab has focused on improving Sb2S3 extremely thin absorber (ETA) solar cells by understanding the hole transfer mechanism in these devices. Currently, Jeff is exploring organo-metal lead halide perovskites for use in photovoltaics, studying alternative hole conductor materials and improving the understanding of these devices.
Title of Dissertation: Mesostructured Thin Film Solar Cells: Examining Hole Transfer Mechanisms and Device Stability