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Thomas Fuja

Thomas E. Fuja

Email: tfuja@nd.edu

Phone: 574-631-7244

Office: 275 Fitzpatrick Hall

Education

Ph.D., Cornell University, 1987

M.S., Cornell University, 1983

B.S., EE & Comp. E University of Michigan, 1981

Biography

Tom Fuja received his undergraduate education at the University of Michigan, graduating with a B.S.E.E. and a B.S.Comp.E. in 1981. He subsequently attended Cornell University, where he received the M.Eng. and Ph.D. degrees in electrical engineering in 1983 and 1987, respectively. Since 1998 Prof. Fuja has been a member of the faculty of the University of Notre Dame in South Bend, IN, where he is currently a professor and Chair of the Department of Electrical Engineering. Previously, from 1987 to 1998, Fuja was on the faculty of the University of Maryland in College Park, MD. In addition, Prof. Fuja served as Program Director for Communications Research at the U.S. National Science Foundation in 1997 and 1998. Prof. Fuja has been very active in the IEEE Information Theory Society, serving in a variety of roles on its Board of Governors from 1988 to 2004 and as its President in 2002. He also served as Associate Editor at Large of IEEE Transactions on Information Theory from 1998 to 2001.

Summary of Activities/Interests

Prof. Fuja research addresses reliable communication over inherently unreliable and/or constrained communication links. He has recently focused his research on the changing role that channel codes play in the context of wireless networks, i.e., to not only provide physical-layer robustness but also to interact with
relaying and network coding architectures to maximize efficiency and performance. Elements of his current research include design of capacity-approaching channel codes (e.g., LDPC and fountain codes) well-suited to wireless networks, techniques for cooperative diversity based on channel coding methodologies, the capacity of wireless erasure networks, and the design and analysis of iterative-decoded communication systems operating at very low bit and frame error rates.