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Flynn to Receive 2016 Technical Achievement Award

Nina Welding • DATE: February 23, 2016

Categories:  Press Release

Patrick J. Flynn, the Duda Family Professor of Engineering, professor of computer science and engineering, and concurrent professor of electrical engineering at the University of Notre Dame, has been selected to receive one of five 2016 Technical Achievement Awards from the Computer Society of the Institute of Electrical and Electronics Engineers (IEEE). He was recognized for “pioneering techniques for biometric identification and for creating a world-class multi-biometric image database.” Given for outstanding and innovative contributions to the fields of computer and information science and engineering or computer technology that have promoted technical progress, the award will be presented at the IEEE Computer Society’s annual meeting in Atlanta, Ga., in June 2016.

Flynn’s research interests include computer vision, biometrics, pattern recognition, computer graphics and scientific visualization, and mobile application development. As co-director of Notre Dame’s Computer Vision Research Laboratory, Flynn and his team continue to make far-reaching contributions to face and iris recognition technologies and novel biometrics. Their work has been supported by a variety of government and industrial sources, such as the National Science Foundation, Oak Ridge National Laboratory, National Institute of Standards and Technology, U.S. Department of Homeland Security, Federal Bureau of Investigation, and Intelligence Advanced Research Projects Activity.

He has received numerous teaching awards from Washington State University and the University of Notre Dame. Flynn also currently serves as a lecturer in the University’s Hesburgh Lecture Series.

A fellow of the IEEE and the International Association for Pattern Recognition, Flynn is a distinguished scientist of the Association for Computing Machinery and a member of the American Society for Engineering Education, the American Academy of Forensic Sciences, and the International Association for Identification. He is the editor-in-chief of the IEEE Biometrics Compendium, the IEEE’s first virtual journal. He has served as a Notre Dame faculty member since 2001.

For the latest information on activities, visit the Computer Vision Research Laboratory.

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