Patrick J Flynn
Duda Family Professor of Engineering
Ph.D, Michigan State University, 1990
M.S., Computer Science, Michigan State University, 1986
B.S., Electrical Engineering, Michigan State University, 1985
Patrick J. Flynn received the B.S. in Electrical Engineering (1985), the M.S. in Computer Science (1986), and the Ph.D. in Computer Science (1990) from Michigan State University, East Lansing. He has held faculty positions at Notre Dame (1990-1991, 2001-present), Washington State University (1991-1998), and Ohio State University (1998-2001). His research interests include computer vision, biometrics, and image processing.
Dr. Flynn is an IEEE Fellow, an IAPR Fellow, and a past Associate Editor of IEEE Trans. on Information Forensics and Security, IEEE Trans. on Image Processing, IEEE Trans. on Pattern Analysis and Machine Intelligence, Pattern Recognition and Pattern Recognition Letters. He is also a past Associate Editor-in-Chief of IEEE Trans. on Pattern Analysis and Machine Intelligence. He is currently the Editor-in-Chief of the IEEE Biometrics Compendium, IEEE's first virtual journal. He has received outstanding teaching awards from Washington State University and the University of Notre Dame.
Summary of Activities/Interests
- Computer Vision
- Pattern Recognition
- Computer Graphics and Scientific Visualization
- Mobile Application Development
Notre Dame California Opens Palo Alto Facility to Support Coursework, Innovation and Collaboration in Silicon Valley
February 24, 2017
February 8, 2017
January 17, 2017